A sub-micrometer resolution hard X-ray microprobe system of BL8C at Pohang Light Source

A microprobe system has been installed on the nanoprobe/XAFS beamline (BL8C) at PLS‐II, South Korea. Owing to the reproducible switch of the gap of the in‐vacuum undulator (IVU), the intense and brilliant hard X‐ray beam of an IVU can be used in X‐ray fluorescence (XRF) and X‐ray absorption fine‐str...

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Veröffentlicht in:Journal of synchrotron radiation 2015-09, Vol.22 (5), p.1306-1311
Hauptverfasser: Sung, Nark-Eon, Lee, Ik-Jae, Lee, Kug-Seong, Jeong, Seong-Hun, Kang, Seen-Woong, Shin, Yong-Bi
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Sprache:eng
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Zusammenfassung:A microprobe system has been installed on the nanoprobe/XAFS beamline (BL8C) at PLS‐II, South Korea. Owing to the reproducible switch of the gap of the in‐vacuum undulator (IVU), the intense and brilliant hard X‐ray beam of an IVU can be used in X‐ray fluorescence (XRF) and X‐ray absorption fine‐structure (XAFS) experiments. For high‐spatial‐resolution microprobe experiments a Kirkpatrick–Baez mirror system has been used to focus the millimeter‐sized X‐ray beam to a micrometer‐sized beam. The performance of this system was examined by a combination of micro‐XRF imaging and micro‐XAFS of a beetle wing. These results indicate that the microprobe system of the BL8C can be used to obtain the distributions of trace elements and chemical and structural information of complex materials.
ISSN:1600-5775
0909-0495
1600-5775
DOI:10.1107/S1600577515014071