Temperature dependent structural and dielectric investigations of PbZr0.5Ti0.5O3 solid solution at the morphotropic phase boundary

PbZr1−xTixO3 ceramics synthesised by low temperature calcination followed by sintering at 1280°C show a Morphotropic Phase Boundary (MPB) for compositions of x=0.44–0.51. The morphotropic phase boundary is wider for samples with smaller grain sizes due to the synthesis route. A Rietveld analysis is...

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Veröffentlicht in:Ceramics international 2013-03, Vol.39 (2), p.1977-1983
Hauptverfasser: Srivastava, Geetika, Goswami, Ankur, Umarji, A.M.
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Sprache:eng
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Zusammenfassung:PbZr1−xTixO3 ceramics synthesised by low temperature calcination followed by sintering at 1280°C show a Morphotropic Phase Boundary (MPB) for compositions of x=0.44–0.51. The morphotropic phase boundary is wider for samples with smaller grain sizes due to the synthesis route. A Rietveld analysis is performed on a composition of x=0.5 composition to quantify the phase fractions of the tetragonal and monoclinic phases present in the PZT system. Temperature dependent X-ray diffraction and dielectric studies of PbZr0.5Ti0.5O3 composition demonstrated a phase transformation from monoclinic to tetragonal at 270°C followed by a ferroelectric tetragonal to a paraelectric cubic transition at 370°C. Thus, the poling of these ceramics should be performed below 270°C to benefit from the presence of a monoclinic phase.
ISSN:0272-8842
1873-3956
DOI:10.1016/j.ceramint.2012.08.049