Development of resonance ionization in a supersonic gas-jet for studies of short-lived and long-lived radioactive nuclei

Development of resonance ionization in a supersonic gas-jet for studies of short-lived and long-lived radioactive nuclei

•Resonance ionization of 93Nb in gas-jet was demonstrated using Ti:Sapphire laser.•The line width of the spectrum in the gas-jet was similar to that in vacuum.•An experimental setup for high-resolution RIS was designed. High-resolution resonance ionization spectroscopy (RIS) is required for laser sp...

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Veröffentlicht in:Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms Beam interactions with materials and atoms, 2013-12, Vol.317, p.586-589
Hauptverfasser: Takatsuka, Takaaki, Tomita, Hideki, Sonnenschein, Volker, Sonoda, Tetsu, Adachi, Yoshitaka, Sakamoto, Chika, Mita, Hiroki, Noto, Takuma, Ito, Chikara, Maeda, Shigetaka, Iguchi, Tetsuo, Wada, Michiharu, Wendt, Klaus, Moore, Iain
Format: Artikel
Sprache:eng
Schlagworte:
Band spectra
Computational fluid dynamics
Computer simulation
Gas jet
Ionization
Laser spectroscopy
Lasers
Mathematical models
Nuclei
Resonance ionization spectroscopy
Spectroscopy
Trace analysis
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Zusammenfassung:•Resonance ionization of 93Nb in gas-jet was demonstrated using Ti:Sapphire laser.•The line width of the spectrum in the gas-jet was similar to that in vacuum.•An experimental setup for high-resolution RIS was designed. High-resolution resonance ionization spectroscopy (RIS) is required for laser spectroscopy and trace analysis of short-lived and long-lived radioactive nuclei. We have proposed high-resolution resonance ionization spectroscopy in a gas jet combined with a narrow band-width injection-locked Ti:Sapphire laser. Resonance ionization of stable 93Nb in a gas jet was demonstrated using a broad bandwidth Ti:Sapphire laser. In addition, a setup for high-resolution RIS in a gas-jet was designed using numerical simulations of the gas-jet conditions based on computational fluid dynamics.
ISSN:0168-583X
1872-9584
DOI:10.1016/j.nimb.2013.05.054