Laser beam induced current microscopy and photocurrent mapping for junction characterization of infrared photodetectors

For non-destructive optical characterization, laser beam induced current （LBIC） microscopy has been developed into as a quantitative tool to examine individual photodiodes within a large pixel array. Two-dimensional LBIC microscopy, also gener- ally called photocurrent mapping （PC mapping）, can provide spatially resolved information about local electrical properties and p-n junction formation in photovoltaic infrared （including visible light） photodetectors from which it is possible to extract material and device parameters such as junction area, junction depth, diffusion length, leakage current position and minority carrier diffusion length etc. This paper presents a comprehensive review of research background, operating principle, funda- mental issues, and applications of LBIC or PC mapping.