Bonding and electronic states of boron in silicon nanowires characterized by an infrared synchrotron radiation beam

The infrared synchrotron radiation (IR-SR) beamline of SPring-8 as an IR light source was applied to characterize boron (B) atoms in silicon nanowires (SiNWs). The use of an IR-SR beam with much higher brilliance than conventional IR light sources and a wide range of wavenumbers from visible to far...

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Veröffentlicht in:Nanoscale 2015-04, Vol.7 (16), p.7246-7251
Hauptverfasser: Fukata, N, Jevasuwan, W, Ikemoto, Y, Moriwaki, T
Format: Artikel
Sprache:eng
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Zusammenfassung:The infrared synchrotron radiation (IR-SR) beamline of SPring-8 as an IR light source was applied to characterize boron (B) atoms in silicon nanowires (SiNWs). The use of an IR-SR beam with much higher brilliance than conventional IR light sources and a wide range of wavenumbers from visible to far IR regions made it possible to detect a local vibrational mode of B in SiNWs. The use of this technique has also made it possible to detect other IR peaks related to transitions of a bound hole from the ground state of a B acceptor atom to excited states, clarifying the electronic state of B acceptors in SiNWs.
ISSN:2040-3364
2040-3372
DOI:10.1039/c5nr00427f