Effect of gadolinium doping on the electronic band structure of europium oxide

High quality films of EuO and Eu sub(0.96) Gd sub(0.04) O were grown on p-type Si(100) via pulsed laser deposition. X-ray-diffraction results show that the addition of Gd changes the growth texture from [001] to [111]. Angular-resolved photoemission spectroscopy reveals electron pockets around the X...

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Veröffentlicht in:Physical review. B, Condensed matter and materials physics Condensed matter and materials physics, 2012-01, Vol.85 (1), p.014406-014406, Article 014406
Hauptverfasser: Colón Santana, Juan A., An, Joonhee M., Wu, Ning, Belashchenko, Kirill D., Wang, Xianjie, Liu, Pan, Tang, Jinke, Losovyj, Yaroslav, Yakovkin, I. N., Dowben, P. A.
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Sprache:eng
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Zusammenfassung:High quality films of EuO and Eu sub(0.96) Gd sub(0.04) O were grown on p-type Si(100) via pulsed laser deposition. X-ray-diffraction results show that the addition of Gd changes the growth texture from [001] to [111]. Angular-resolved photoemission spectroscopy reveals electron pockets around the X points in Gd-doped EuO, indicating that the band gap in EuO is indirect. Combined photoemission and inverse photoemission measurements show an apparent transition from n-type to p-type behavior, which is likely due to band bending near the polar (111) surface.
ISSN:1098-0121
1550-235X
DOI:10.1103/PhysRevB.85.014406