Effect of gadolinium doping on the electronic band structure of europium oxide
High quality films of EuO and Eu sub(0.96) Gd sub(0.04) O were grown on p-type Si(100) via pulsed laser deposition. X-ray-diffraction results show that the addition of Gd changes the growth texture from [001] to [111]. Angular-resolved photoemission spectroscopy reveals electron pockets around the X...
Gespeichert in:
Veröffentlicht in: | Physical review. B, Condensed matter and materials physics Condensed matter and materials physics, 2012-01, Vol.85 (1), p.014406-014406, Article 014406 |
---|---|
Hauptverfasser: | , , , , , , , , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | High quality films of EuO and Eu sub(0.96) Gd sub(0.04) O were grown on p-type Si(100) via pulsed laser deposition. X-ray-diffraction results show that the addition of Gd changes the growth texture from [001] to [111]. Angular-resolved photoemission spectroscopy reveals electron pockets around the X points in Gd-doped EuO, indicating that the band gap in EuO is indirect. Combined photoemission and inverse photoemission measurements show an apparent transition from n-type to p-type behavior, which is likely due to band bending near the polar (111) surface. |
---|---|
ISSN: | 1098-0121 1550-235X |
DOI: | 10.1103/PhysRevB.85.014406 |