Electronic Band Structures and Native Point Defects of Ultrafine ZnO Nanocrystals

Ultrafine ZnO nanocrystals with a thickness down to 0.25 nm are grown by a metalorganic chemical vapor deposition method. Electronic band structures and native point defects of ZnO nanocrystals are studied by a combination of scanning tunneling microscopy/spectroscopy and first-principles density fu...

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Veröffentlicht in:ACS applied materials & interfaces 2015-05, Vol.7 (19), p.10617-10622
Hauptverfasser: Zeng, Yu-Jia, Schouteden, Koen, Amini, Mozhgan N, Ruan, Shuang-Chen, Lu, Yang-Fan, Ye, Zhi-Zhen, Partoens, Bart, Lamoen, Dirk, Van Haesendonck, Chris
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Sprache:eng
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Zusammenfassung:Ultrafine ZnO nanocrystals with a thickness down to 0.25 nm are grown by a metalorganic chemical vapor deposition method. Electronic band structures and native point defects of ZnO nanocrystals are studied by a combination of scanning tunneling microscopy/spectroscopy and first-principles density functional theory calculations. Below a critical thickness of ∼1 nm ZnO adopts a graphitic-like structure and exhibits a wide band gap similar to its wurtzite counterpart. The hexagonal wurtzite structure, with a well-developed band gap evident from scanning tunneling spectroscopy, is established for a thickness starting from ∼1.4 nm. With further increase of the thickness to 2 nm, V O –V Zn defect pairs are easily produced in ZnO nanocrystals due to the self-compensation effect in highly doped semiconductors.
ISSN:1944-8244
1944-8252
DOI:10.1021/acsami.5b02545