The off-state gate isolation technique to improve ASET tolerance in differential analog design

A novel off-state gate RHBD technique to mitigate the single-event transient （SET） in the differential data path of analog cir- cuit is demonstrated in this paper. Simulation results present that this off-state gate technique could exploit charge sharing in differential circuits and reduce differential mode voltage perturbation effectively. It is indicated that this technique is more ef- fective to mitigate SET than the differential charge cancellation （DCC） technique with less penalty.