Study on Ductile Damage Progress of Aluminum Single Crystal Using Synchrotron White X-Ray

A ductile damage progress of FCC single crystal was verified by a profile analysis using white X-ray obtained in BL28B2 beam line of SPring-8. In this study, an aluminum single crystal of the purity 6N was used as a specimen prepared in I-type geometry for tensile test. A notch was introduced into o...

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Veröffentlicht in:Materials science forum 2013-09, Vol.768-769, p.358-365
Hauptverfasser: Kiso, Minoru, Kobayashi, Michiaki, Kajiwara, Kentaro, Shibano, Junichi, Shobu, Takahisa, Miura, Setsuo
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Sprache:eng
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Zusammenfassung:A ductile damage progress of FCC single crystal was verified by a profile analysis using white X-ray obtained in BL28B2 beam line of SPring-8. In this study, an aluminum single crystal of the purity 6N was used as a specimen prepared in I-type geometry for tensile test. A notch was introduced into one side of the center of a parallel part of the specimen by the wire electric discharge machining. White X-ray, which has 100 microns in height and 200 microns in width, was incident into the specimen on the Bragg angle θ of 3 degrees using energy dispersive X-ray diffraction technique. The specimen was deformed by elongation along crystal orientation [001], and a diffraction profile of the white X-ray which penetrated it was analyzed. In profile analysis, an instrumental function was defined in consideration both of a divergence by a slit and a response function peculiar to the energy dispersive method. The Gauss component of integral breadth related to non-uniform strain and the Cauchy component of integral breadth related to crystallite size were determined by eliminating the broadening by the instrumental function from the diffraction profile of white X-ray. As a result, the direction of progress and the characteristics of ductile damage near the notch of the aluminum single crystal were clarified from the Gauss component and the Cauchy component of integral width of the single diffraction profile.
ISSN:0255-5476
1662-9752
1662-9752
DOI:10.4028/www.scientific.net/MSF.768-769.358