X-ray photon correlation spectroscopy
In recent years, X‐ray photon correlation spectroscopy (XPCS) has emerged as one of the key probes of slow nanoscale fluctuations, applicable to a wide range of condensed matter and materials systems. This article briefly reviews the basic principles of XPCS as well as some of its recent application...
Gespeichert in:
Veröffentlicht in: | Journal of synchrotron radiation 2014-09, Vol.21 (5), p.1057-1064 |
---|---|
1. Verfasser: | |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | In recent years, X‐ray photon correlation spectroscopy (XPCS) has emerged as one of the key probes of slow nanoscale fluctuations, applicable to a wide range of condensed matter and materials systems. This article briefly reviews the basic principles of XPCS as well as some of its recent applications, and discusses some novel approaches to XPCS analysis. It concludes with a discussion of the future impact of diffraction‐limited storage rings on new types of XPCS experiments, pushing the temporal resolution to nanosecond and possibly even picosecond time scales. |
---|---|
ISSN: | 1600-5775 0909-0495 1600-5775 |
DOI: | 10.1107/S1600577514018232 |