Features of Transmission EBSD and its Application
Features of transmission electron backscatter diffraction (EBSD) observation with a standard EBSD ( s -EBSD) detector are surveyed in this study. Heavily deformed Al and 8Cr tempered martensite transmission electron microscope (TEM) specimens were used for this study. It is shown that a specimen til...
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| Veröffentlicht in: | JOM (1989) 2013-09, Vol.65 (9), p.1254-1263 |
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| container_title | JOM (1989) |
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| creator | Suzuki, Seiichi |
| description | Features of transmission electron backscatter diffraction (EBSD) observation with a standard EBSD (
s
-EBSD) detector are surveyed in this study. Heavily deformed Al and 8Cr tempered martensite transmission electron microscope (TEM) specimens were used for this study. It is shown that a specimen tilt angle of ~30°–40° in the opposite direction of the usual 70° and a smaller working distance in the range 4 mm–5 mm are recommended when using a
s
-EBSD detector. Specimen thickness and accelerating voltage (Acc.V) have a strong affect on the quality of transmission EBSD patterns and orientation maps. Higher Acc.Vs are generally recommended to get good quality orientation maps. In case of very thin specimens, lowering the Acc.Vs will give better results. In the observation of a thin film of an 8Cr tempered martensite steel specimen, it is confirmed that
t
-EBSD can provide images and detailed quantitative orientation data comparable with that obtained by TEM. It is also shown that small precipitates of Cr
23
C
6
with sizes around 30 nm could be detected and their orientations measured. |
| doi_str_mv | 10.1007/s11837-013-0700-6 |
| format | Article |
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s
-EBSD) detector are surveyed in this study. Heavily deformed Al and 8Cr tempered martensite transmission electron microscope (TEM) specimens were used for this study. It is shown that a specimen tilt angle of ~30°–40° in the opposite direction of the usual 70° and a smaller working distance in the range 4 mm–5 mm are recommended when using a
s
-EBSD detector. Specimen thickness and accelerating voltage (Acc.V) have a strong affect on the quality of transmission EBSD patterns and orientation maps. Higher Acc.Vs are generally recommended to get good quality orientation maps. In case of very thin specimens, lowering the Acc.Vs will give better results. In the observation of a thin film of an 8Cr tempered martensite steel specimen, it is confirmed that
t
-EBSD can provide images and detailed quantitative orientation data comparable with that obtained by TEM. It is also shown that small precipitates of Cr
23
C
6
with sizes around 30 nm could be detected and their orientations measured.</description><identifier>ISSN: 1047-4838</identifier><identifier>EISSN: 1543-1851</identifier><identifier>DOI: 10.1007/s11837-013-0700-6</identifier><identifier>CODEN: JOMMER</identifier><language>eng</language><publisher>Boston: Springer US</publisher><subject>Algorithms ; Aluminum ; Automation ; Chemistry/Food Science ; Deformation ; Diffraction ; Earth Sciences ; Electron back scatter diffraction ; Electrons ; Engineering ; Environment ; Formations ; Geometry ; Grains ; Materials science ; Pattern recognition ; Physics ; Sensors ; Studies ; Thin films ; Titanium dioxide</subject><ispartof>JOM (1989), 2013-09, Vol.65 (9), p.1254-1263</ispartof><rights>The Author(s) 2013</rights><rights>Copyright Springer Science & Business Media Sep 2013</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c458t-8b03338a84159279f3eccd0d5d6b5fd4f882a984649721631505794efd92ce8e3</citedby><cites>FETCH-LOGICAL-c458t-8b03338a84159279f3eccd0d5d6b5fd4f882a984649721631505794efd92ce8e3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1007/s11837-013-0700-6$$EPDF$$P50$$Gspringer$$Hfree_for_read</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1007/s11837-013-0700-6$$EHTML$$P50$$Gspringer$$Hfree_for_read</linktohtml><link.rule.ids>314,780,784,27924,27925,41488,42557,51319</link.rule.ids></links><search><creatorcontrib>Suzuki, Seiichi</creatorcontrib><title>Features of Transmission EBSD and its Application</title><title>JOM (1989)</title><addtitle>JOM</addtitle><description>Features of transmission electron backscatter diffraction (EBSD) observation with a standard EBSD (
s
-EBSD) detector are surveyed in this study. Heavily deformed Al and 8Cr tempered martensite transmission electron microscope (TEM) specimens were used for this study. It is shown that a specimen tilt angle of ~30°–40° in the opposite direction of the usual 70° and a smaller working distance in the range 4 mm–5 mm are recommended when using a
s
-EBSD detector. Specimen thickness and accelerating voltage (Acc.V) have a strong affect on the quality of transmission EBSD patterns and orientation maps. Higher Acc.Vs are generally recommended to get good quality orientation maps. In case of very thin specimens, lowering the Acc.Vs will give better results. In the observation of a thin film of an 8Cr tempered martensite steel specimen, it is confirmed that
t
-EBSD can provide images and detailed quantitative orientation data comparable with that obtained by TEM. It is also shown that small precipitates of Cr
23
C
6
with sizes around 30 nm could be detected and their orientations measured.</description><subject>Algorithms</subject><subject>Aluminum</subject><subject>Automation</subject><subject>Chemistry/Food Science</subject><subject>Deformation</subject><subject>Diffraction</subject><subject>Earth Sciences</subject><subject>Electron back scatter diffraction</subject><subject>Electrons</subject><subject>Engineering</subject><subject>Environment</subject><subject>Formations</subject><subject>Geometry</subject><subject>Grains</subject><subject>Materials science</subject><subject>Pattern recognition</subject><subject>Physics</subject><subject>Sensors</subject><subject>Studies</subject><subject>Thin films</subject><subject>Titanium 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(1989)</jtitle><stitle>JOM</stitle><date>2013-09-01</date><risdate>2013</risdate><volume>65</volume><issue>9</issue><spage>1254</spage><epage>1263</epage><pages>1254-1263</pages><issn>1047-4838</issn><eissn>1543-1851</eissn><coden>JOMMER</coden><abstract>Features of transmission electron backscatter diffraction (EBSD) observation with a standard EBSD (
s
-EBSD) detector are surveyed in this study. Heavily deformed Al and 8Cr tempered martensite transmission electron microscope (TEM) specimens were used for this study. It is shown that a specimen tilt angle of ~30°–40° in the opposite direction of the usual 70° and a smaller working distance in the range 4 mm–5 mm are recommended when using a
s
-EBSD detector. Specimen thickness and accelerating voltage (Acc.V) have a strong affect on the quality of transmission EBSD patterns and orientation maps. Higher Acc.Vs are generally recommended to get good quality orientation maps. In case of very thin specimens, lowering the Acc.Vs will give better results. In the observation of a thin film of an 8Cr tempered martensite steel specimen, it is confirmed that
t
-EBSD can provide images and detailed quantitative orientation data comparable with that obtained by TEM. It is also shown that small precipitates of Cr
23
C
6
with sizes around 30 nm could be detected and their orientations measured.</abstract><cop>Boston</cop><pub>Springer US</pub><doi>10.1007/s11837-013-0700-6</doi><tpages>10</tpages><oa>free_for_read</oa></addata></record> |
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| issn | 1047-4838 1543-1851 |
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| subjects | Algorithms Aluminum Automation Chemistry/Food Science Deformation Diffraction Earth Sciences Electron back scatter diffraction Electrons Engineering Environment Formations Geometry Grains Materials science Pattern recognition Physics Sensors Studies Thin films Titanium dioxide |
| title | Features of Transmission EBSD and its Application |
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