Interference-Free Determination of REEs in Electronic Waste Using ICP Optical Emission Spectroscopy

Recently, the demand for REEs （rare earth elements） has been heavily increasing, as they are used in many high-tech products （e.g., because of their specific magnetic behavior）. As a result, the supply situation for REEs is worsening and the world market is depending on Chinese exports, so that it may be worthwhile to recycle e-waste （electronic waste） in European countries. This article describes an analytical method to analyze REEs in different kinds of e-waste with the help of a simultaneous ICP-OES （ICP optical emission spectrometer）. The task is challenging because samples show significant differences in terms of major, minor and trace element concentrations. Depending on the field of application, the level of matrix elements and target elements differs completely, resulting in a wide variety of spectral interferences. The method presented in this article allows an accurate quantification of REEs as well as a high sample throughput. In addition to REEs, other elements of economic interest can be determined in the same way. The development of a sample preparation process is another important issue and considered as well.