Effect of film thickness and biaxial strain on the curie temperature of EuO

Effect of film thickness and biaxial strain on the curie temperature of EuO

The effects of film thickness and epitaxial strain on the magnetic properties of commensurate EuO thin films grown on single crystalline (001) yttria-stabilized zirconia (YSZ) and (110) LuAlO3 substrates are presented. Magnetic measurements show a reduction in the Curie temperature (TC) for EuO/YSZ...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Applied physics letters 2013-02, Vol.102 (6)
Hauptverfasser: Melville, A., Mairoser, T., Schmehl, A., Birol, T., Heeg, T., Holländer, B., Schubert, J., Fennie, C. J., Schlom, D. G.
Format: Artikel
Sprache:eng
Schlagworte:
Crystal structure
Curie temperature
Epitaxial growth
Film thickness
Reduction
Strain
Thin films
Yttria stabilized zirconia
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The effects of film thickness and epitaxial strain on the magnetic properties of commensurate EuO thin films grown on single crystalline (001) yttria-stabilized zirconia (YSZ) and (110) LuAlO3 substrates are presented. Magnetic measurements show a reduction in the Curie temperature (TC) for EuO/YSZ films thinner than ∼10 nm. Additionally, the EuO/LuAlO3 films exhibit a systematically lower TC than the corresponding EuO/YSZ films. This further reduction in TC is attributed to the effect of biaxial tensile strain arising from lattice mismatch: 0.0% for EuO/YSZ and +1.0% for EuO/LuAlO3.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.4789972