A Fast Terahertz Spectrometer Based on Frequency Selective Surface Filters

We present a fast spectrometer working in the 0.7–4.8 THz range. Broadband radiation from a blackbody source is focused first on a rotating silicon wafer, whose surface was patterned with 18 metal band-pass filters, then on the sample under test and finally is detected by a superconducting microbolo...

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Veröffentlicht in:	Journal of infrared, millimeter and terahertz waves millimeter and terahertz waves, 2012-05, Vol.33 (5), p.505-512
Hauptverfasser:	Carelli, P., Chiarello, F., Cibella, S., Di Gaspare, A., Leoni, R., Ortolani, M., Torrioli, G.
Format:	Artikel
Sprache:	eng
Schlagworte:	Bandpass filters Black body radiation Bolometers Broadband Classical Electrodynamics Coolers Detectors Electrical Engineering Electronics and Microelectronics Engineering Frequencies Frequency selective surfaces Hard surfacing Instrumentation Microorganisms Q factors Signal to noise ratio Silicon wafers Spectra Spectral resolution Spectrometers Spiral antennas Time constant
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