Photoreflectance and photocurrent measurements using pressure tuned laser diodes
Photoreflectance (PR) and photocurrent (PC) measurements have been demonstrated in the 1250–1600 nm spectral range using an external‐cavity pressure‐tuned laser diode as the source of monochromatic light. Compared to conventional PR and PC methods using monochromated light from the lamp, it allows t...
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Veröffentlicht in: | Physica Status Solidi. B: Basic Solid State Physics 2013-04, Vol.250 (4), p.708-710 |
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Hauptverfasser: | , , , , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | Photoreflectance (PR) and photocurrent (PC) measurements have been demonstrated in the 1250–1600 nm spectral range using an external‐cavity pressure‐tuned laser diode as the source of monochromatic light. Compared to conventional PR and PC methods using monochromated light from the lamp, it allows to achieve a smaller spot so that micro‐PR and micro‐PC are possible either directly or with fiber coupled beam. In case of PR, it also allows to eliminate spurious photoluminescence signal. |
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ISSN: | 0370-1972 1521-3951 |
DOI: | 10.1002/pssb.201200645 |