Statistical modeling of inter-device correlations with BPV

The backward propagation of variance (BPV) technique for statistical modeling has proven to be efficient and effective in practice. In this paper we extend the BPV formalism to explicitly include modeling of the correlations between electrical performances. The new formulation is verified by applyin...

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Veröffentlicht in:	Solid-state electronics 2010-08, Vol.54 (8), p.796-800
Hauptverfasser:	Stevanović, Ivica, Li, Xin, McAndrew, Colin C., Green, Keith R., Gildenblat, Gennady
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Backward propagation of variance Correlation Device correlation Electronics Exact sciences and technology Formalism Mathematical models MOSFETs Semiconductor device modeling Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Statistical modeling Transistors Variance
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Zusammenfassung:	The backward propagation of variance (BPV) technique for statistical modeling has proven to be efficient and effective in practice. In this paper we extend the BPV formalism to explicitly include modeling of the correlations between electrical performances. The new formulation is verified by applying it to two different MOSFET models and two different manufacturing technologies.
ISSN:	0038-1101 1879-2405
DOI:	10.1016/j.sse.2010.03.018