Effects of corner angle of trapezoidal and triangular channel cross-sections on electrical performance of silicon nanowire field-effect transistors with semi gate-around structure

Structural effects, especially corner angle of upper-corners of trapezoidal and rectangular, and triangular cross-sectional shapes of silicon nanowire field-effect transistors on effective carrier mobility and normalized inversion charge density have been investigated. 〈100〉-directed silicon nanowir...

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Veröffentlicht in:Solid-state electronics 2011-11, Vol.65-66, p.2-8
Hauptverfasser: Sato, Soshi, Kakushima, Kuniyuki, Ahmet, Parhat, Ohmori, Kenji, Natori, Kenji, Yamada, Keisaku, Iwai, Hiroshi
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Sprache:eng
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