The refractive nonlinearities of InAs/GaAs quantum dots above-bandgap energy

The third-order optical nonlinear refractive properties of InAs/GaAs quantum dots grown by molecular beam epitaxy have been measured using the reflection Z-scan technique at above-bandgap energy. The nonlinear refractive index and nonlinear absorption index of the InAs/GaAs quantum dots were determi...

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Veröffentlicht in:Optics communications 2010-04, Vol.283 (7), p.1510-1513
Hauptverfasser: Huang, X., Zhang, X.H., Zhu, Y.G., Li, T., Han, L.F., Shang, X.J., Ni, H.Q., Niu, Z.C.
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Sprache:eng
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Zusammenfassung:The third-order optical nonlinear refractive properties of InAs/GaAs quantum dots grown by molecular beam epitaxy have been measured using the reflection Z-scan technique at above-bandgap energy. The nonlinear refractive index and nonlinear absorption index of the InAs/GaAs quantum dots were determined for wavelengths from 740 to 777 nm. The measured results are compared with the nonlinear refractive response of several typical III–V group semiconductor materials. The corresponding mechanisms responsible for the large nonlinear response are discussed.
ISSN:0030-4018
1873-0310
DOI:10.1016/j.optcom.2009.12.002