Over 100 A operation normally-off AlGaN/GaN hybrid MOS-HFET on Si substrate with high-breakdown voltage

The demonstration of a normally-off n-channel AlGaN/GaN hybrid metal–oxide–semiconductor heterojunction field-effect transistor (MOS-HFET) on Si substrate for large-current operation is reported. The AlGaN/GaN hybrid MOS-HFET has the merits of both a MOS channel and an AlGaN/GaN heterostructure with...

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Veröffentlicht in:Solid-state electronics 2010-06, Vol.54 (6), p.660-664
Hauptverfasser: Kambayashi, Hiroshi, Satoh, Yoshihiro, Ootomo, Shinya, Kokawa, Takuya, Nomura, Takehiko, Kato, Sadahiro, Chow, Tat-sing Pawl
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Sprache:eng
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Zusammenfassung:The demonstration of a normally-off n-channel AlGaN/GaN hybrid metal–oxide–semiconductor heterojunction field-effect transistor (MOS-HFET) on Si substrate for large-current operation is reported. The AlGaN/GaN hybrid MOS-HFET has the merits of both a MOS channel and an AlGaN/GaN heterostructure with high mobility two dimensional electron gases (2DEG). The maximum drain current of over 100 A with 2 μm channel length and 340 mm channel width is performed. This is the best value for a normally-off GaN-based field-effect transistor. The specific on-state resistance is 9.3 mΩ cm 2. The fabricated device also exhibits good normally-off operation with the threshold voltage of 2.7 V and the breakdown voltage of over 600 V.
ISSN:0038-1101
1879-2405
DOI:10.1016/j.sse.2010.01.001