Nuclear targets for a precision measurement of the neutral pion radiative width

Nuclear targets for a precision measurement of the neutral pion radiative width

A technique is presented for precision measurements of the area densities, ρT, of approximately 5% radiation length carbon and 208Pb targets used in an experiment at Jefferson Laboratory to measure the neutral pion radiative width. The precision obtained in the area density for the carbon target is...

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Veröffentlicht in:Nucl.Instrum.Meth.A 2009-12, Vol.612 (1), p.46-49
Hauptverfasser: Martel, P., Clinton, E., McWilliams, R., Lawrence, D., Miskimen, R., Ahmidouch, A., Ambrozewicz, P., Asratyan, A., Baker, K., Benton, L., Bernstein, A., Cole, P., Collins, P., Dale, D., Danagoulian, S., Davidenko, G., Demirchyan, R., Deur, A., Dolgolenko, A., Dzyubenko, G., Evdokimov, A., Feng, J., Gabrielyan, M., Gan, L., Gasparian, A., Glamazdin, O., Goryachev, V., Gyurjyan, V., Hardy, K., Ito, M., Khandaker, M., Kingsberry, P., Kolarkar, A., Konchatnyi, M., Korchin, O., Korsch, W., Kowalski, S., Kubantsev, M., Kubarovsky, V., Larin, I., Matveev, V., McNulty, D., Milbrath, B., Minehart, R., Mochalov, V., Mtingwa, S., Nakagawa, I., Overby, S., Pasyuk, E., Payen, M., Pedroni, R., Prok, Y., Ritchie, B., Salgado, C., Sitnikov, A., Sober, D., Stephens, W., Teymurazyan, A., Underwood, J., Vasiliev, A., Verebryusov, V., Vishnyakov, V., Wood, M.
Format: Artikel
Sprache:eng
Schlagworte:
Accelerators
ACCURACY
Area density
ATTENUATION
CARBON
CEBAF ACCELERATOR
Density
Detectors
PARTICLE ACCELERATORS
PIONS
RADIATION LENGTH
Solid nuclear targets
Spectrometers
TARGETS
X-ray attenuation
X-rays
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Beschreibung
Zusammenfassung:A technique is presented for precision measurements of the area densities, ρT, of approximately 5% radiation length carbon and 208Pb targets used in an experiment at Jefferson Laboratory to measure the neutral pion radiative width. The precision obtained in the area density for the carbon target is ±0.050%, and that obtained for the lead target through an X-ray attenuation technique is ±0.43%.
ISSN:0168-9002
1872-9576
DOI:10.1016/j.nima.2009.09.063