Development of a method and apparatus for measuring the light-reflecting characteristics of infrared optoelectronic systems

Questions related to the study of the light-reflecting characteristics of optoelectronic systems that function in the infrared domain are considered. A method and combined structural and functional optical apparatus scheme is proposed that makes it possible to perform measurements of the light-reflecting characteristics of modern infrared devices; a mathematical apparatus for processing the measurement results is also proposed. The expected value of the error of such measurements is determined.[PUBLICATION ABSTRACT]