Si(100)-2 x 1-H dimer rows contrast inversion in low-temperature scanning tunneling microscope images

Detailed low temperature scanning tunneling microscope images of the Si(100)-2 x 1-H surface show a remarkable contrast inversion between filled- and empty-state images where the hydrogen dimer rows appear bright for filled-state images and dark for empty-state images. This contrast inversion origin...

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Veröffentlicht in:Surface science 2015-02, Vol.632, p.L13-L17
Hauptverfasser: Yap, T L, Kawai, H, Neucheva, O A, Wee, A TS, Troadec, C, Saeys, M, Joachim, C
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Sprache:eng
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Zusammenfassung:Detailed low temperature scanning tunneling microscope images of the Si(100)-2 x 1-H surface show a remarkable contrast inversion between filled- and empty-state images where the hydrogen dimer rows appear bright for filled-state images and dark for empty-state images. This contrast inversion originates from the change in the dominant surface states and their coupling to the tip apex and the bulk silicon channels as a function of the bias voltage: dimer Si-Si bonding states dominate the filled-state images and valley states associated with Si-Si anti-bonding states dominate the empty-state images. Care is required when constructing and interpreting the atomic structure of dangling-bond structures on the Si(100)-2 x 1-H surface.
ISSN:0039-6028
DOI:10.1016/j.susc.2014.10.016