Si(100)-2 x 1-H dimer rows contrast inversion in low-temperature scanning tunneling microscope images
Detailed low temperature scanning tunneling microscope images of the Si(100)-2 x 1-H surface show a remarkable contrast inversion between filled- and empty-state images where the hydrogen dimer rows appear bright for filled-state images and dark for empty-state images. This contrast inversion origin...
Gespeichert in:
Veröffentlicht in: | Surface science 2015-02, Vol.632, p.L13-L17 |
---|---|
Hauptverfasser: | , , , , , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | Detailed low temperature scanning tunneling microscope images of the Si(100)-2 x 1-H surface show a remarkable contrast inversion between filled- and empty-state images where the hydrogen dimer rows appear bright for filled-state images and dark for empty-state images. This contrast inversion originates from the change in the dominant surface states and their coupling to the tip apex and the bulk silicon channels as a function of the bias voltage: dimer Si-Si bonding states dominate the filled-state images and valley states associated with Si-Si anti-bonding states dominate the empty-state images. Care is required when constructing and interpreting the atomic structure of dangling-bond structures on the Si(100)-2 x 1-H surface. |
---|---|
ISSN: | 0039-6028 |
DOI: | 10.1016/j.susc.2014.10.016 |