Solution-processable all-small molecular bulk heterojunction films for stable organic photodetectors: near UV and visible light sensing

We report stable organic photodetectors with all-small molecular bulk heterojunction (BHJ) sensing layers prepared using solutions of electron-donating and electron-accepting small molecules. As an electron-donating molecule, 2,5-bis(2-ethylhexyl)-3,6-bis(4′-methyl-[2,2′-bithiophen]-5-yl)pyrrolo[3,4...

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Veröffentlicht in:Journal of materials chemistry. C, Materials for optical and electronic devices Materials for optical and electronic devices, 2015-01, Vol.3 (7), p.1513-1520
Hauptverfasser: Lee, Hyena, Nam, Sungho, Kwon, Hyunju, Lee, Sooyong, Kim, Jungnam, Lee, Woongki, Lee, Chulyeon, Jeong, Jaehoon, Kim, Hwajeong, Shin, Tae Joo, Kim, Youngkyoo
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Sprache:eng
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Zusammenfassung:We report stable organic photodetectors with all-small molecular bulk heterojunction (BHJ) sensing layers prepared using solutions of electron-donating and electron-accepting small molecules. As an electron-donating molecule, 2,5-bis(2-ethylhexyl)-3,6-bis(4′-methyl-[2,2′-bithiophen]-5-yl)pyrrolo[3,4- c ]pyrrole-1,4(2 H ,5 H )-dione (EHTPPD-MT) was synthesized via a Stille coupling reaction, whereas [6,6]-phenyl-C 61 -butyric acid methyl ester (PC 61 BM) was used as an electron-accepting component. The devices with the EHTPPD-MT:PC 61 BM BHJ layer could detect photons at a wavelength of 400–800 nm and exhibited a stable photoresponse under on/off modulation of near UV (405 nm) and visible (532 nm and 650 nm) light even at bias voltage conditions. The corrected responsivity reached ∼175 mA W −1 for the near UV detection at −1 V. An extremely durable photoresponse was measured for the present devices (including flexible devices) under illumination with high intensity green light (133.4 mW cm −2 at 532 nm) which is much stronger than standard sun light (100 mW cm −2 , white). The excellent stability has been attributed to the tiny EHTPPD-MT crystals, which are formed in the EHTPPD-MT:PC 61 BM layers during the coating processes.
ISSN:2050-7526
2050-7534
DOI:10.1039/C4TC02194K