Statistics and methodology of multiple cell upset characterization under heavy ion irradiation

Statistics and methodology of multiple cell upset characterization under heavy ion irradiation

Mean and partial cross-section concepts and their connections to multiplicity and statistics of multiple cell upsets (MCUs) in highly-scaled digital memories are introduced and discussed. The important role of the experimental determination of the upset statistics is emphasized. It was found that MC...

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Veröffentlicht in:Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment Accelerators, spectrometers, detectors and associated equipment, 2015-03, Vol.775, p.41-45
Hauptverfasser: Zebrev, G.I., Gorbunov, M.S., Useinov, R.G., Emeliyanov, V.V., Ozerov, A.I., Anashin, V.S., Kozyukov, A.E., Zemtsov, K.S.
Format: Artikel
Sprache:eng
Schlagworte:
Accelerators
Cross sections
Cross sections (physics)
Cross-section
Digital
Energy transfer
Heavy ions
Interpolation
Ion irradiation
Joints
Linear energy transfer
Memory cell
Multiple cell upsets
Single event effects
Statistics
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Zusammenfassung:Mean and partial cross-section concepts and their connections to multiplicity and statistics of multiple cell upsets (MCUs) in highly-scaled digital memories are introduced and discussed. The important role of the experimental determination of the upset statistics is emphasized. It was found that MCU may lead to quasi-linear dependence of cross-sections on linear energy transfer (LET). A new form of function for interpolation of mean cross-section dependences on LET has been proposed.
ISSN:0168-9002
1872-9576
DOI:10.1016/j.nima.2014.11.106