Characterization of solar cells by thermal transient testing

The current paper deals with the application of thermal transient testing as a characterization tool for solar modules. Based on the measurement of different samples (concentrator solar cell, single junction silicon solar cell) we prove the applicability of this measurement technique and address some specific issues of the characterization of solar cells by the thermal transient method. From the measurement metrics such as junction-to-base plate thermal resistance and thermal capacitance(s) can be derived and can serve as a basis of a multi domain solar cell model. The used technique also enables us to verify the quality of attachment layers in a solar module allowing fair quality control and reliability analysis of these devices. Finally a method is proposed to regain the data that is covered by the initial electric transient following the power step. This initial electric transient can be high in large surface devices like solar cells, and covers valuable data describing the structure near to the p–n junction. To eliminate this, simulated transients were fitted to the part of the actual measured thermal transient where the electric transient already decayed. This way the part of the thermal transient that was covered by the electric transient can be reconstructed.