Laser-induced oxidation of titanium substrate: Analysis of the physicochemical structure of the surface and sub-surface layers

•Chemical structure of the films induced by laser on titanium surface was analyzed.•It was shown that outer layer of this films consist of oxides doped with nitrogen.•The optical properties of the laser-induced oxynitride films were characterized.•We found that the films demonstrated significant abs...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Applied surface science 2015, Vol.325, p.217-226
Hauptverfasser: Antończak, Arkadiusz J., Skowroński, Łukasz, Trzcinski, Marek, Kinzhybalo, Vasyl V., Łazarek, Łukasz K., Abramski, Krzysztof M.
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:•Chemical structure of the films induced by laser on titanium surface was analyzed.•It was shown that outer layer of this films consist of oxides doped with nitrogen.•The optical properties of the laser-induced oxynitride films were characterized.•We found that the films demonstrated significant absorption in the band of 300–580nm.•The morphology of the layers as a function of the laser fluence was investigated. This paper presents the results of the analysis of the complex chemical structure of the layers made on titanium in the process of the heating of its surfaces in an atmospheric environment, by irradiating samples with a nanosecond-pulsed laser. The study was carried out for electroplated, high purity, polycrystalline titanium substrates using a Yb:glass fiber laser. All measurements were made for samples irradiated in a broad range of accumulated fluence, below the ablation threshold. It has been determined how the complex index of refraction of both the oxynitride layers and the substrate vary as a function of accumulated laser fluence. It was also shown that the top layer of the film produced on titanium, which is transparent, is not a pure TiO2 as had been supposed before. The XPS and XRD analyses confirmed the presence of nitrogen compounds and the existence of nonstoichiometric compounds. By sputtering of the sample's surface using an Ar+ ion gun, the changes in the concentration of individual elements as a function of the layer's cross-section were determined. Lastly, an analysis of the surface morphology has also been carried out, explaining why the layers crack and exfoliate from their substrate.
ISSN:0169-4332
1873-5584
DOI:10.1016/j.apsusc.2014.11.062