X-ray fluorescence evaluation of the surface density of vanadium nanolayers on various substrates
An auxiliary system in the form of thin vanadium layers on polymer film substrates has been used in surface density determinations. We have calculated correction coefficients that take into account the absorption of the primary radiation of an X-ray tube and that of analytical lines of the elements...
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| Veröffentlicht in: | Inorganic materials 2015, Vol.51 (1), p.38-42 |
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| container_issue | 1 |
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| container_title | Inorganic materials |
| container_volume | 51 |
| creator | Mashin, N. I. Chernyaeva, E. A. Tumanova, A. N. |
| description | An auxiliary system in the form of thin vanadium layers on polymer film substrates has been used in surface density determinations. We have calculated correction coefficients that take into account the absorption of the primary radiation of an X-ray tube and that of analytical lines of the elements present in the substrate. A technique has been developed that allows one to determine the surface density of thin films when samples and references are located on substrates from different materials. |
| doi_str_mv | 10.1134/S0020168515010124 |
| format | Article |
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| ispartof | Inorganic materials, 2015, Vol.51 (1), p.38-42 |
| issn | 0020-1685 1608-3172 |
| language | eng |
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| source | SpringerLink Journals - AutoHoldings |
| subjects | Chemistry Chemistry and Materials Science Density Industrial Chemistry/Chemical Engineering Inorganic Chemistry Materials Science Mathematical analysis Nanostructure Surface chemistry Thin films Vanadium X-ray fluorescence X-ray tubes |
| title | X-ray fluorescence evaluation of the surface density of vanadium nanolayers on various substrates |
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