An Insight into the Role of Oxygen Vacancy in Hydrogenated TiO2 Nanocrystals in the Performance of Dye-Sensitized Solar Cells

Hydrogenated titanium dioxide (H-TiO2) nanocrystals were successfully prepared via annealing TiO2 in H2/N2 mixed gas flow at elevated temperatures ranging from 300 to 600 °C. Electron paramagnetic resonance (EPR) spectra were used to determine the produced oxygen vacancy in H-TiO2. Variations in tem...

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Veröffentlicht in:ACS applied materials & interfaces 2015-02, Vol.7 (6), p.3754-3763
Hauptverfasser: Su, Ting, Yang, Yulin, Na, Yong, Fan, Ruiqing, Li, Liang, Wei, Liguo, Yang, Bin, Cao, Wenwu
Format: Artikel
Sprache:eng
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Zusammenfassung:Hydrogenated titanium dioxide (H-TiO2) nanocrystals were successfully prepared via annealing TiO2 in H2/N2 mixed gas flow at elevated temperatures ranging from 300 to 600 °C. Electron paramagnetic resonance (EPR) spectra were used to determine the produced oxygen vacancy in H-TiO2. Variations in temperature were studied to investigate the concentration change of oxygen vacancy in H-TiO2. The H-TiO2 nanocrystals prepared at different temperatures were employed into photoanodes sensitized by N719 dye and found to have exceptional effect on the solar-to-electric energy conversion efficiency (η). Photoanodes with H-TiO2 nanocrystals hydrogenated at 300 °C show the highest short-circuit current density (J sc) of 18.92 mA cm–2 and photoelectrical conversion efficiency of 7.76% under standard AM 1.5 global solar irradiation, indicating a 27 and 28% enhancement in J sc and η, respectively, in comparison to those with TiO2. The enhancement is attributed to high donor density, narrow band gap and positive shift of flat band energy (Vfb) of H-TiO2 that promote the driving force for electron injection. Intensity-modulated photocurrent spectroscopy (IMPS) accompanied by intensity-modulated photovoltage spectroscopy (IMVS) and other analyses were applied to shed more light on the fundamental mechanisms inside the charge transfer and transport in these systems.
ISSN:1944-8244
1944-8252
DOI:10.1021/am5085447