Electronic structure of low-pressure and high-pressure phases of silicon disulfide

Self-consistent density functional theory calculations of band spectra, densities of states as well as the spatial distribution of valence electron charge density were carried out for the low-pressure α -phase and the high-pressure β -phase of SiS 2 . Group-theoretical analysis performed for both ph...

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Veröffentlicht in:Applied physics. A, Materials science & processing Materials science & processing, 2014-11, Vol.117 (3), p.1499-1514
Hauptverfasser: Bletskan, D. I., Vakulchak, V. V., Glukhov, K. E.
Format: Artikel
Sprache:eng
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Zusammenfassung:Self-consistent density functional theory calculations of band spectra, densities of states as well as the spatial distribution of valence electron charge density were carried out for the low-pressure α -phase and the high-pressure β -phase of SiS 2 . Group-theoretical analysis performed for both phases enabled the symmetry of wave functions in a number of high-symmetry points of the Brillouin zone as well as the structure of valence band representations to be found. Based on the calculations of the band structure, the orthorhombic α -phase of SiS 2 was determined to be an indirect-gap semiconductor with the band gap E gi  = 2.44 eV ( T 1  →  X 8 transition), while the β -phase was shown to be direct gap with E gd  = 2.95 eV ( Г 3  →  Г 2 transition). The calculated energy distribution of the total density of states in the valence band of α -SiS 2 qualitatively and quantitatively correlates with the main experimental features of the X-ray photoelectron spectrum.
ISSN:0947-8396
1432-0630
DOI:10.1007/s00339-014-8584-z