Built-in sensor based on current supply high-frequency behaviour

A built-in sensor based on the detection of highest frequency components of the dynamic current supply of the circuit under test is proposed. In analogue SI circuits, there are faults difficult to detect using conventional test methods. It is possible to detect these faults by the changes in the slo...

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Veröffentlicht in:Electronics letters 2003-05, Vol.39 (10), p.1-1
Hauptverfasser: Lechuga, Y, Mozuelos, R, Martínez, M, Bracho, S
Format: Artikel
Sprache:eng
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Zusammenfassung:A built-in sensor based on the detection of highest frequency components of the dynamic current supply of the circuit under test is proposed. In analogue SI circuits, there are faults difficult to detect using conventional test methods. It is possible to detect these faults by the changes in the slope of the dynamic current supply.
ISSN:0013-5194
1350-911X