Fabrication of highly transparent self-switching diodes using single layer indium tin oxide

The fabrication of a self-switching diode (SSD) from a single layer of n-type indium tin oxide [In^sub 2^O^sub 3^:Sn (ITO)] is reported. The material was grown using a reactive thermal evaporation and nanostructured using a focused ion beam. The resultant device demonstrates strong current rectifica...

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Veröffentlicht in:Electronics letters 2009-01, Vol.45 (1), p.1-1
Hauptverfasser: Kettle, J, Perks, R M, Hoyle, R T
Format: Artikel
Sprache:eng
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Zusammenfassung:The fabrication of a self-switching diode (SSD) from a single layer of n-type indium tin oxide [In^sub 2^O^sub 3^:Sn (ITO)] is reported. The material was grown using a reactive thermal evaporation and nanostructured using a focused ion beam. The resultant device demonstrates strong current rectification, as well as a high threshold and breakdown voltage, owing to the higher density of states associated with the material when compared to other reported SSD-device material. It is shown that this work could potentially lead to a range of new transparent devices based on ITO without the need to develop high quality ptype material.
ISSN:0013-5194
1350-911X