Secondary ion mass spectrometry for Mg tracer diffusion: issues and solutions

Secondary ion mass spectrometry for Mg tracer diffusion: issues and solutions

A secondary ion mass spectrometry (SIMS) method has been developed to measure stable Mg isotope tracer diffusion. This SIMS method was then used to calculate Mg self‐diffusivities, and the data was verified against historical data measured using radiotracers. The SIMS method has been validated as a...

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Veröffentlicht in:Surface and interface analysis 2014-11, Vol.46 (S1), p.291-293
Hauptverfasser: Tuggle, Jay, Giordani, Andrew, Kulkarni, Nagraj, Warmack, Bruce, Hunter, Jerry
Format: Artikel
Sprache:eng
Schlagworte:
annealing
diffusion
Diffusion coefficient
induced topography
Interface analysis
Isotopes
Magnesium
Mathematical analysis
Mg alloys
Mg diffusivities
Routines
Secondary ion mass spectrometry
self-diffusion
SIMS
topography formation
Tracer diffusion
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Zusammenfassung:A secondary ion mass spectrometry (SIMS) method has been developed to measure stable Mg isotope tracer diffusion. This SIMS method was then used to calculate Mg self‐diffusivities, and the data was verified against historical data measured using radiotracers. The SIMS method has been validated as a reliable alternative to the radiotracer technique for the measurement of Mg self‐diffusion coefficients and can be used as a routine method for determining diffusion coefficients. Copyright © 2014 John Wiley & Sons, Ltd.
ISSN:0142-2421
1096-9918
DOI:10.1002/sia.5618