CMOS 2D Hall microsensor with minimal design complexity

CMOS 2D Hall microsensor with minimal design complexity

A new silicon integrated 2D Hall sensor for high-accuracy magnetic-field in-plane vector measurements fabricated through a CMOS technology, has been suggested and tested. Its unique advantage is minimal design complexity: only four external connections, lack of cross-sensitivity between the channels...

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Veröffentlicht in:Electronics letters 2007-04, Vol.43 (9), p.1-1
Hauptverfasser: Roumenin, Ch S, Lozanova, S V
Format: Artikel
Sprache:eng
Schlagworte:
Channels
CMOS
Complexity
Joints
Magnetoresistivity
Mathematical analysis
Two dimensional
Vectors (mathematics)
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Beschreibung
Zusammenfassung:A new silicon integrated 2D Hall sensor for high-accuracy magnetic-field in-plane vector measurements fabricated through a CMOS technology, has been suggested and tested. Its unique advantage is minimal design complexity: only four external connections, lack of cross-sensitivity between the channels and very high resolution. In addition, a simple, but highly effective circuitry fully compensates for the offsets and the nonlinear magnetoresistance of the two outputs.
ISSN:0013-5194
1350-911X