Algorithm for reduction of noise in ultramicroscopy and application to near-field microwave microscopy

Algorithm for reduction of noise in ultramicroscopy and application to near-field microwave microscopy

An approach is introduced to improve the performance of a class of scanning probe microscopy techniques; in principle all techniques exploiting some frequency dependent characteristic could potentially benefit from the proposed approach. Application of the approach in a new near-field microwave micr...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Electronics letters 2010-01, Vol.46 (1), p.1-1
Hauptverfasser: Farina, M, Lucesoli, A, di Donato, A, Mencarelli, D, Maccari, L, Venanzoni, G, Morini, A, Rozzi, T
Format: Artikel
Sprache:eng
Schlagworte:
Algorithms
Microscopes
Microscopy
Microwaves
Noise reduction
Performance enhancement
Reduction
Scanning probe microscopy
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:An approach is introduced to improve the performance of a class of scanning probe microscopy techniques; in principle all techniques exploiting some frequency dependent characteristic could potentially benefit from the proposed approach. Application of the approach in a new near-field microwave microscope setup is reported.
ISSN:0013-5194
1350-911X