Effect of annealing on structural and optical properties of copper tetraphenylporphyrin (CuTPP) thin films

Thin films of CuTPP were prepared by thermal evaporation techniques. X-ray diffraction technique, Infrared spectra and scanning electron microscope were used to investigate the crystalline structure and morphologies of CuTPP thin films before and after annealing. The optical properties of the as-deposited and annealed CuTPP thin films were investigated by using spectrometric measurements at nearly normal incidence of light in the wavelength range 200–2500nm. The type of electronic transition and the optical energy gap were estimated by using the obtained data of the absorption index, k, for the as-deposited and annealed CuTPP films. The third order nonlinear susceptibility was estimated for as-deposited and annealed CuTPP thin films. The dispersion parameters and the real and imaginary parts of dielectric constant were also calculated. •The effects of annealing on the optical properties of CuTPP films have been reported.•X-ray diffraction, IR and SEM have been used to identify the structure properties.•From fundamental absorption edge, a picture of the energetic transitions of was described.•A single-oscillator model & Drude model were used to describe the refractive index.