Effect of light induced degradation on electrical transport and charge extraction in polythiophene:Fullerene (P3HT:PCBM) solar cells
We investigate the photodegradation in inert atmosphere of (poly 3-hexylthiophene:[6,6]-phenyl-C61-butyric acid methyl ester) (P3HT:PCBM) heterojunction solar cells under continuous illumination using advanced electrical characterization and a device modeling tool. Our results indicate that differen...
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Veröffentlicht in: | Solar energy materials and solar cells 2014-01, Vol.120, p.244-252 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | We investigate the photodegradation in inert atmosphere of (poly 3-hexylthiophene:[6,6]-phenyl-C61-butyric acid methyl ester) (P3HT:PCBM) heterojunction solar cells under continuous illumination using advanced electrical characterization and a device modeling tool. Our results indicate that different failure mechanisms contribute to the performance loss. The first 250h of illumination induced p-type doping and recombination related to traps in the blend which mainly decreases the short-circuit current and the efficiency of the cells. Device modeling and simulation allowed us to prove that increased p-type doping of the blend provoke the loss in the short-circuit current and the quantum efficiency by simultaneous reduction of charge carrier mobility and the electric field together with a shrink of the space charge region. Transmission electron microscopy (TEM) measurements reveal a change in the blend morphology upon long illumination times manifested by phase segregation in the blend. The reduction in the open-circuit voltage is reported to be related to a slight reduction of the charge transfer energy (CT) upon 700h of illumination aging. The final failure mechanism was a rapid drop in the fill factor which occurs upon 1000h of illumination and manifested by the appearance of an S-shape J–V characteristic. This failure mechanism is linked to the reduction of charge extraction caused by a reduced surface recombination velocity at the contacts.
•We gained detailed insight into the gradual degradation of P3HT:PCBM OSCs aged under different illumination conditions.•We applied numerous advanced electrical characterization techniques and a modeling software tool (SCAPS) to explain the failure mechanisms.•In the first hours of illumination an increase of traps and doping in the blend is reported.•The last failure mechanisms are a change in the blend morphology and reduction of charge extraction at the contacts. |
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ISSN: | 0927-0248 1879-3398 |
DOI: | 10.1016/j.solmat.2013.09.010 |