Junction studies on electrochemically fabricated p-n Cu sub(2)O homojunction solar cells for efficiency enhancement

p-n Cu sub(2)O homojunction solar cells were electrochemically fabricated by consecutively depositing an n-Cu sub(2)O layer on a p-Cu sub(2)O layer. In order to better understand the Fermi levels of the electrochemically grown polycrystalline p- and n-Cu sub(2)O layers and maximize the overall cell performance, the back and front contacts of the Cu sub(2)O homojunction cells were systematically changed and the I-Vcharacteristics of the resulting cells were examined. The result shows that the intrinsic doping levels of the electrochemically prepared p-Cu sub(2)O and n-Cu sub(2)O layers are very low and they made almost Ohmic junctions with Cu metal with which previously studied p-Cu sub(2)O layers prepared by thermal oxidation of Cu foils are known to form Schottky junctions. The best cell performance (an eta of 1.06%, a V sub(OC) of 0.621 V, an I sub(SC) of 4.07 mA cm super(-2), and a fill factor (ff) of 42%) was obtained when the p-Cu sub(2)O layer was deposited on a commercially available ITO substrate as the back contact and a sputter deposited ITO layer was used as the front contact on the n-Cu sub(2)O layer. The unique features of the p-n Cu sub(2)O homojunction solar cell are discussed in comparison with other Cu sub(2)O-based heterojunction solar cells.