Effect of metal/bulk-heterojunction interfacial properties on organic photovoltaic device performance

Effect of metal/bulk-heterojunction interfacial properties on organic photovoltaic device performance

Interfacial properties between evaporated metal contacts and active layer in organic photovoltaic devices critically affect device performance. Through a controlled mechanical delamination method, the interfaces between annealed P3HT:PCBM BHJ layer and Al or Ag electrodes are revealed for direct che...

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Veröffentlicht in:Journal of materials chemistry. A, Materials for energy and sustainability Materials for energy and sustainability, 2014-01, Vol.2 (37), p.15288-15293
Hauptverfasser: Wang, Jian, Friedman, Claire R., Cabrera, Wilfredo, Tan, Kui, Lee, Yun-Ju, Chabal, Yves J., Hsu, Julia W. P.
Format: Artikel
Sprache:eng
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Zusammenfassung:Interfacial properties between evaporated metal contacts and active layer in organic photovoltaic devices critically affect device performance. Through a controlled mechanical delamination method, the interfaces between annealed P3HT:PCBM BHJ layer and Al or Ag electrodes are revealed for direct chemical characterization. The difference in the interfacial, rather than bulk, properties account for the different OPV device performance.
ISSN:2050-7488
2050-7496
DOI:10.1039/C4TA02519A