Effects of ammonia concentration on property of Cd sub(1-x)Zn sub(x)S films by chemical bath deposition

Cd sub(1-x)Zn sub(x)S thin films were grown on soda-lime glass substrates by chemical-bath deposition (CBD) at 80 degree C with stirring. All the samples were annealed at 200 degree C for 60 min in the air. The crystal structure, surface morphology, thickness and optical properties of the films were...

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Veröffentlicht in:Materials science in semiconductor processing 2014-03, Vol.19, p.78-82
Hauptverfasser: Dong, Yuejie, Zhou, Limei, Wu, Sumei
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description Cd sub(1-x)Zn sub(x)S thin films were grown on soda-lime glass substrates by chemical-bath deposition (CBD) at 80 degree C with stirring. All the samples were annealed at 200 degree C for 60 min in the air. The crystal structure, surface morphology, thickness and optical properties of the films were studied with transmission electron microscopy (TEM), X-ray diffraction (XRD), scanning electron microscopy (SEM), step height measurement instrument and spectrophotometer respectively. The results revealed that Cd sub(1-x)Zn sub(x)S thin films had cubic crystal structure and the intensity of the diffraction peak increased gradually as ammonia concentration rose and the grain size varied from 5.1 to 8.3 nm. All of Cd sub(1-x)Zn sub(x)S thin films had a granular surface with some smaller pores and the average granule sizes increased from 92 to 163 nm with an increase in ammonia concentration. The Cd sub(1-x)Zn sub(x)S thin films had the highest transmittance with ammonia concentration of 0.5 M L super(-1), whose thickness was 50 nm and band gap was 2.62 eV.
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fullrecord <record><control><sourceid>proquest</sourceid><recordid>TN_cdi_proquest_miscellaneous_1567078871</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>1567078871</sourcerecordid><originalsourceid>FETCH-proquest_miscellaneous_15670788713</originalsourceid><addsrcrecordid>eNqVjLtOw0AQRbcAifD4Aaopk8LLTKzYpo6C6KFKE603s2SjfRjPWkr-ngTxA0hXOrc4Oko9E2pCal6OOooMeolUayKNNd2oGdXNa9Uh0p26Fzki4mpJzUx9bZxjWwSyAxNjTt6AzclyKqMpPie4bBjzwGM5X6X1HmTq51SdFtv0e0-LD3A-RIH-DPbA0VsToDflAHsesvhr5lHdOhOEn_74oOZvm8_1e3Vpf08sZRe9WA7BJM6T7GjVtNh2XUv1P9Qf9kdQPQ</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1567078871</pqid></control><display><type>article</type><title>Effects of ammonia concentration on property of Cd sub(1-x)Zn sub(x)S films by chemical bath deposition</title><source>Elsevier ScienceDirect Journals</source><creator>Dong, Yuejie ; Zhou, Limei ; Wu, Sumei</creator><creatorcontrib>Dong, Yuejie ; Zhou, Limei ; Wu, Sumei</creatorcontrib><description>Cd sub(1-x)Zn sub(x)S thin films were grown on soda-lime glass substrates by chemical-bath deposition (CBD) at 80 degree C with stirring. All the samples were annealed at 200 degree C for 60 min in the air. The crystal structure, surface morphology, thickness and optical properties of the films were studied with transmission electron microscopy (TEM), X-ray diffraction (XRD), scanning electron microscopy (SEM), step height measurement instrument and spectrophotometer respectively. The results revealed that Cd sub(1-x)Zn sub(x)S thin films had cubic crystal structure and the intensity of the diffraction peak increased gradually as ammonia concentration rose and the grain size varied from 5.1 to 8.3 nm. All of Cd sub(1-x)Zn sub(x)S thin films had a granular surface with some smaller pores and the average granule sizes increased from 92 to 163 nm with an increase in ammonia concentration. The Cd sub(1-x)Zn sub(x)S thin films had the highest transmittance with ammonia concentration of 0.5 M L super(-1), whose thickness was 50 nm and band gap was 2.62 eV.</description><identifier>ISSN: 1369-8001</identifier><identifier>DOI: 10.1016/j.mssp.2013.11.031</identifier><language>eng</language><subject>Ammonia ; Crystal structure ; Deposition ; Diffraction ; Granular materials ; Scanning electron microscopy ; Semiconductors ; Thin films</subject><ispartof>Materials science in semiconductor processing, 2014-03, Vol.19, p.78-82</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27901,27902</link.rule.ids></links><search><creatorcontrib>Dong, Yuejie</creatorcontrib><creatorcontrib>Zhou, Limei</creatorcontrib><creatorcontrib>Wu, Sumei</creatorcontrib><title>Effects of ammonia concentration on property of Cd sub(1-x)Zn sub(x)S films by chemical bath deposition</title><title>Materials science in semiconductor processing</title><description>Cd sub(1-x)Zn sub(x)S thin films were grown on soda-lime glass substrates by chemical-bath deposition (CBD) at 80 degree C with stirring. All the samples were annealed at 200 degree C for 60 min in the air. The crystal structure, surface morphology, thickness and optical properties of the films were studied with transmission electron microscopy (TEM), X-ray diffraction (XRD), scanning electron microscopy (SEM), step height measurement instrument and spectrophotometer respectively. The results revealed that Cd sub(1-x)Zn sub(x)S thin films had cubic crystal structure and the intensity of the diffraction peak increased gradually as ammonia concentration rose and the grain size varied from 5.1 to 8.3 nm. All of Cd sub(1-x)Zn sub(x)S thin films had a granular surface with some smaller pores and the average granule sizes increased from 92 to 163 nm with an increase in ammonia concentration. The Cd sub(1-x)Zn sub(x)S thin films had the highest transmittance with ammonia concentration of 0.5 M L super(-1), whose thickness was 50 nm and band gap was 2.62 eV.</description><subject>Ammonia</subject><subject>Crystal structure</subject><subject>Deposition</subject><subject>Diffraction</subject><subject>Granular materials</subject><subject>Scanning electron microscopy</subject><subject>Semiconductors</subject><subject>Thin films</subject><issn>1369-8001</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2014</creationdate><recordtype>article</recordtype><recordid>eNqVjLtOw0AQRbcAifD4Aaopk8LLTKzYpo6C6KFKE603s2SjfRjPWkr-ngTxA0hXOrc4Oko9E2pCal6OOooMeolUayKNNd2oGdXNa9Uh0p26Fzki4mpJzUx9bZxjWwSyAxNjTt6AzclyKqMpPie4bBjzwGM5X6X1HmTq51SdFtv0e0-LD3A-RIH-DPbA0VsToDflAHsesvhr5lHdOhOEn_74oOZvm8_1e3Vpf08sZRe9WA7BJM6T7GjVtNh2XUv1P9Qf9kdQPQ</recordid><startdate>20140301</startdate><enddate>20140301</enddate><creator>Dong, Yuejie</creator><creator>Zhou, Limei</creator><creator>Wu, Sumei</creator><scope>7SP</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>20140301</creationdate><title>Effects of ammonia concentration on property of Cd sub(1-x)Zn sub(x)S films by chemical bath deposition</title><author>Dong, Yuejie ; Zhou, Limei ; Wu, Sumei</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-proquest_miscellaneous_15670788713</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2014</creationdate><topic>Ammonia</topic><topic>Crystal structure</topic><topic>Deposition</topic><topic>Diffraction</topic><topic>Granular materials</topic><topic>Scanning electron microscopy</topic><topic>Semiconductors</topic><topic>Thin films</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Dong, Yuejie</creatorcontrib><creatorcontrib>Zhou, Limei</creatorcontrib><creatorcontrib>Wu, Sumei</creatorcontrib><collection>Electronics &amp; Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Materials science in semiconductor processing</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Dong, Yuejie</au><au>Zhou, Limei</au><au>Wu, Sumei</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Effects of ammonia concentration on property of Cd sub(1-x)Zn sub(x)S films by chemical bath deposition</atitle><jtitle>Materials science in semiconductor processing</jtitle><date>2014-03-01</date><risdate>2014</risdate><volume>19</volume><spage>78</spage><epage>82</epage><pages>78-82</pages><issn>1369-8001</issn><abstract>Cd sub(1-x)Zn sub(x)S thin films were grown on soda-lime glass substrates by chemical-bath deposition (CBD) at 80 degree C with stirring. All the samples were annealed at 200 degree C for 60 min in the air. The crystal structure, surface morphology, thickness and optical properties of the films were studied with transmission electron microscopy (TEM), X-ray diffraction (XRD), scanning electron microscopy (SEM), step height measurement instrument and spectrophotometer respectively. The results revealed that Cd sub(1-x)Zn sub(x)S thin films had cubic crystal structure and the intensity of the diffraction peak increased gradually as ammonia concentration rose and the grain size varied from 5.1 to 8.3 nm. All of Cd sub(1-x)Zn sub(x)S thin films had a granular surface with some smaller pores and the average granule sizes increased from 92 to 163 nm with an increase in ammonia concentration. The Cd sub(1-x)Zn sub(x)S thin films had the highest transmittance with ammonia concentration of 0.5 M L super(-1), whose thickness was 50 nm and band gap was 2.62 eV.</abstract><doi>10.1016/j.mssp.2013.11.031</doi></addata></record>
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subjects Ammonia
Crystal structure
Deposition
Diffraction
Granular materials
Scanning electron microscopy
Semiconductors
Thin films
title Effects of ammonia concentration on property of Cd sub(1-x)Zn sub(x)S films by chemical bath deposition
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-02T09%3A42%3A40IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Effects%20of%20ammonia%20concentration%20on%20property%20of%20Cd%20sub(1-x)Zn%20sub(x)S%20films%20by%20chemical%20bath%20deposition&rft.jtitle=Materials%20science%20in%20semiconductor%20processing&rft.au=Dong,%20Yuejie&rft.date=2014-03-01&rft.volume=19&rft.spage=78&rft.epage=82&rft.pages=78-82&rft.issn=1369-8001&rft_id=info:doi/10.1016/j.mssp.2013.11.031&rft_dat=%3Cproquest%3E1567078871%3C/proquest%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1567078871&rft_id=info:pmid/&rfr_iscdi=true