Severity Evaluation Methods in Common Bean Recurrent Selection Programme for Resistance to Angular Leaf Spot

The objectives of this study were to identify which method and period of evaluation of angular leaf spot (ALS) of common bean, caused by the fungal pathogen Pseudocercospora griseola, allow better discrimination among common bean lines derived from seven cycles of recurrent selection for resistance to this pathogen. For that reason, 35 lines of the first seven cycles of the programme were assessed for disease severity on leaves and pods using a rating scale. For leaves, the methods used were severity in field plots (SF), severity in sampled leaflets (SS) and percentage of the sampled leaf area with symptoms (%LAS). Leaf assessments were performed at 7, 14, 21, 28, 33 and 41 days after flowering (DAF), and area under the disease progress curve (AUDPC) was calculated. On pods, severity was evaluated at 41 DAF. It was observed that the SF using a rating scale is the most efficient method for selection of resistant lines, and the best time period for evaluating the disease is around 33 DAF.