Rectifying the Current-Voltage Characteristics of a LiNbO sub(3) Film/GaN Heterojunction

Epitaxial LiNbO sub(3) (LNO) films are grown on n-type GaN semiconductor substrates, forming LNO/GaN p-n junctions. The current-voltage (I-V) and capacitance-voltage (C-V) characteristics of the junctions are studied. The I-V curve shows a clear rectifying property with a turn-on voltage of 2.4 V. F...

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Veröffentlicht in:Chinese physics letters 2011-01, Vol.28 (10), p.107703-1-107703-4
Hauptverfasser: HAO, Lan-Zhong, LIU, Yun-Jie, ZHU, Jun, LEI, Hua-Wei, LIU, Ying-Ying, TANG, Zheng-Yu, ZHANG, Ying, ZHANG, Wan-Li, LI, Yan-Rong
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Sprache:eng
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Zusammenfassung:Epitaxial LiNbO sub(3) (LNO) films are grown on n-type GaN semiconductor substrates, forming LNO/GaN p-n junctions. The current-voltage (I-V) and capacitance-voltage (C-V) characteristics of the junctions are studied. The I-V curve shows a clear rectifying property with a turn-on voltage of 2.4 V. For the forward voltages, the conduction mechanism transits from Schottky thermionic emission for low voltages to space-charge-limited current, for large voltages. Reverse C-V characteristics exhibit a linear 1/C super(2) versus V plot, from which a built-in potential of 0.34 V is deduced. These results are explained using the energy-hand structure of the LNO/GaN junction.
ISSN:0256-307X
1741-3540
DOI:10.1088/0256-307X/28/10/107703