A study on the electrical and optical characteristics of IGZO films
The electrical and optical properties of InGaZnO (IGZO) thin films were studied in the research. It was found that all the films deposited at room temperature exhibit amorphous structures. A better film quality was obtained at a lower pressure with sputtering ambiance. The RF power toward the IZO ta...
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Veröffentlicht in: | Journal of materials science. Materials in electronics 2014-07, Vol.25 (7), p.3077-3084 |
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Hauptverfasser: | , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | The electrical and optical properties of InGaZnO (IGZO) thin films were studied in the research. It was found that all the films deposited at room temperature exhibit amorphous structures. A better film quality was obtained at a lower pressure with sputtering ambiance. The RF power toward the IZO target was constant at 125 W; the RF power toward the Ga
2
O
3
target varied from 0 to 70 W. A best IGZO film with corresponding resistivity, carrier concentration, and mobility is 7.94 × 10
−4
Ω-cm, 1.68 × 10
20
cm
−3
, and 47 cm
2
/V-s, respectively. Due to the doping of gallium in the IGZO film, it led to a lower resistivity than that of the IZO film. A blue shift effect of the film was also observed in the doping of gallium to the IGZO film. The H
2
plasma effects toward the IGZO were also observed. |
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ISSN: | 0957-4522 1573-482X |
DOI: | 10.1007/s10854-014-1986-z |