Application of a multiline material characterization method to inkjet printed electronics

ABSTRACT Material characterization has become increasingly important with the adoption of simulation‐based workflow for microwave electronics design. This article focuses on the characterization of printable electronics materials using transmission‐line measurements and demonstrates the capability of the multiline characterization method to separate dielectric and conductor losses when line geometry and material properties vary between the lines. The effects of multiline algorithm, number of line standards, and methods for selecting optimal line lengths are demonstrated. Consistent characterization results are obtained from inkjet‐printed transmission lines on two different substrate materials. In addition, local conductor thickness variations are demonstrated as an effective way to decrease losses. Finally, the simulation‐based procedure for determining the material properties is outlined and applied to printable electronics characterization. © 2013 Wiley Periodicals, Inc. Int J RF and Microwave CAE 24:177–183, 2014.