Acoustic emissions document stress changes over many seismic cycles in stick-slip experiments

The statistics of large earthquakes commonly involve large uncertainties due to the lack of long‐term, robust earthquake recordings. Small‐scale seismic events are abundant and can be used to examine variations in fault structure and stress. We report on the connection between stress and microseismi...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Geophysical research letters 2013-05, Vol.40 (10), p.2049-2054
Hauptverfasser: W. Goebel, T. H., Schorlemmer, D., Becker, T. W., Dresen, G., Sammis, C. G.
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The statistics of large earthquakes commonly involve large uncertainties due to the lack of long‐term, robust earthquake recordings. Small‐scale seismic events are abundant and can be used to examine variations in fault structure and stress. We report on the connection between stress and microseismic event statistics prior to the possibly smallest earthquakes: those generated in the laboratory. We investigate variations in seismic b value of acoustic emission events during the stress buildup and release on laboratory‐created fault zones. We show that b values mirror periodic stress changes that occur during series of stick‐slip events, and are correlated with stress over many seismic cycles. Moreover, the amount of b value increase associated with slip events indicates the extent of the corresponding stress drop. Consequently, b value variations can be used to approximate the stress state on a fault: a possible tool for the advancement of time‐dependent seismic hazard assessment. Key Points series of seismic cycles on structurally‐complex, laboratory‐created faultsb value is connected to applied stress over many seismic cyclesincrease in b value correlates with stress release during failure
ISSN:0094-8276
1944-8007
DOI:10.1002/grl.50507