Realization of Na-doped p-type non-polar a-plane Zn1−xCdxO films by pulsed laser deposition

•The Cd content in Zn1−xCdxO films was adjusted via controlling substrate temperature.•Na-doped non-polar Zn1−xCdxO films exhibit p-type conductivity.•XPS spectra confirm that Na incorporated in the films exists as NaZn.•Room-temperature PL measurements exhibit redshift of the NBE emission by alloyi...

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Veröffentlicht in:Journal of alloys and compounds 2014-01, Vol.584, p.466-470
Hauptverfasser: Li, Y., Pan, X.H., Jiang, J., He, H.P., Huang, J.Y., Ye, C.L., Ye, Z.Z.
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container_end_page 470
container_issue
container_start_page 466
container_title Journal of alloys and compounds
container_volume 584
creator Li, Y.
Pan, X.H.
Jiang, J.
He, H.P.
Huang, J.Y.
Ye, C.L.
Ye, Z.Z.
description •The Cd content in Zn1−xCdxO films was adjusted via controlling substrate temperature.•Na-doped non-polar Zn1−xCdxO films exhibit p-type conductivity.•XPS spectra confirm that Na incorporated in the films exists as NaZn.•Room-temperature PL measurements exhibit redshift of the NBE emission by alloying Cd. Na-doped non-polar Zn1−xCdxO thin films with different Cd content were grown on r-plane sapphire substrates by pulsed laser deposition. The Cd content in the Zn1−xCdxO thin films was adjusted via controlling substrate temperature. Based on the X-ray diffraction analysis, Na-doped Zn1−xCdxO films with Cd content below 5.3at.% exhibit unique non-polar 〈112¯0〉 orientation, while the films with Cd content above 5.3at.% present 〈0001〉 and 〈112¯0〉 mixed orientations. With an effective incorporation of Na, Na-doped non-polar Zn1−xCdxO films exhibit p-type conductivity, as confirmed by rectification behavior of n-ZnO/p-Zn0.947Cd0.053O:Na homojunction. An optimized result with a resistivity of 67.43Ωcm, Hall mobility of 0.28cm2/Vs, and hole concentration of 3.31×1017 cm−3 is achieved, and electrically stable over several months. The chemical states of Na were analyzed by X-ray photoelectron spectro scopy. Room-temperature photoluminescence measurements exhibit redshift of the near-band-edge emission by alloying Cd.
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Na-doped non-polar Zn1−xCdxO thin films with different Cd content were grown on r-plane sapphire substrates by pulsed laser deposition. The Cd content in the Zn1−xCdxO thin films was adjusted via controlling substrate temperature. Based on the X-ray diffraction analysis, Na-doped Zn1−xCdxO films with Cd content below 5.3at.% exhibit unique non-polar 〈112¯0〉 orientation, while the films with Cd content above 5.3at.% present 〈0001〉 and 〈112¯0〉 mixed orientations. With an effective incorporation of Na, Na-doped non-polar Zn1−xCdxO films exhibit p-type conductivity, as confirmed by rectification behavior of n-ZnO/p-Zn0.947Cd0.053O:Na homojunction. An optimized result with a resistivity of 67.43Ωcm, Hall mobility of 0.28cm2/Vs, and hole concentration of 3.31×1017 cm−3 is achieved, and electrically stable over several months. The chemical states of Na were analyzed by X-ray photoelectron spectro scopy. 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Na-doped non-polar Zn1−xCdxO thin films with different Cd content were grown on r-plane sapphire substrates by pulsed laser deposition. The Cd content in the Zn1−xCdxO thin films was adjusted via controlling substrate temperature. Based on the X-ray diffraction analysis, Na-doped Zn1−xCdxO films with Cd content below 5.3at.% exhibit unique non-polar 〈112¯0〉 orientation, while the films with Cd content above 5.3at.% present 〈0001〉 and 〈112¯0〉 mixed orientations. With an effective incorporation of Na, Na-doped non-polar Zn1−xCdxO films exhibit p-type conductivity, as confirmed by rectification behavior of n-ZnO/p-Zn0.947Cd0.053O:Na homojunction. An optimized result with a resistivity of 67.43Ωcm, Hall mobility of 0.28cm2/Vs, and hole concentration of 3.31×1017 cm−3 is achieved, and electrically stable over several months. The chemical states of Na were analyzed by X-ray photoelectron spectro scopy. 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Na-doped non-polar Zn1−xCdxO thin films with different Cd content were grown on r-plane sapphire substrates by pulsed laser deposition. The Cd content in the Zn1−xCdxO thin films was adjusted via controlling substrate temperature. Based on the X-ray diffraction analysis, Na-doped Zn1−xCdxO films with Cd content below 5.3at.% exhibit unique non-polar 〈112¯0〉 orientation, while the films with Cd content above 5.3at.% present 〈0001〉 and 〈112¯0〉 mixed orientations. With an effective incorporation of Na, Na-doped non-polar Zn1−xCdxO films exhibit p-type conductivity, as confirmed by rectification behavior of n-ZnO/p-Zn0.947Cd0.053O:Na homojunction. An optimized result with a resistivity of 67.43Ωcm, Hall mobility of 0.28cm2/Vs, and hole concentration of 3.31×1017 cm−3 is achieved, and electrically stable over several months. The chemical states of Na were analyzed by X-ray photoelectron spectro scopy. 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subjects Alloys
Cadmium
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Diffraction
Electrical resistivity
Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures
Electronic transport phenomena in thin films and low-dimensional structures
Exact sciences and technology
Na-doped
Non-polar
Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation
Optical properties of specific thin films
Orientation
P-type
Photoluminescence
Physics
Pulsed laser deposition
Thin films
Zn1−xCdxO thin films
title Realization of Na-doped p-type non-polar a-plane Zn1−xCdxO films by pulsed laser deposition
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