Realization of Na-doped p-type non-polar a-plane Zn1−xCdxO films by pulsed laser deposition
•The Cd content in Zn1−xCdxO films was adjusted via controlling substrate temperature.•Na-doped non-polar Zn1−xCdxO films exhibit p-type conductivity.•XPS spectra confirm that Na incorporated in the films exists as NaZn.•Room-temperature PL measurements exhibit redshift of the NBE emission by alloyi...
Gespeichert in:
Veröffentlicht in: | Journal of alloys and compounds 2014-01, Vol.584, p.466-470 |
---|---|
Hauptverfasser: | , , , , , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | •The Cd content in Zn1−xCdxO films was adjusted via controlling substrate temperature.•Na-doped non-polar Zn1−xCdxO films exhibit p-type conductivity.•XPS spectra confirm that Na incorporated in the films exists as NaZn.•Room-temperature PL measurements exhibit redshift of the NBE emission by alloying Cd.
Na-doped non-polar Zn1−xCdxO thin films with different Cd content were grown on r-plane sapphire substrates by pulsed laser deposition. The Cd content in the Zn1−xCdxO thin films was adjusted via controlling substrate temperature. Based on the X-ray diffraction analysis, Na-doped Zn1−xCdxO films with Cd content below 5.3at.% exhibit unique non-polar 〈112¯0〉 orientation, while the films with Cd content above 5.3at.% present 〈0001〉 and 〈112¯0〉 mixed orientations. With an effective incorporation of Na, Na-doped non-polar Zn1−xCdxO films exhibit p-type conductivity, as confirmed by rectification behavior of n-ZnO/p-Zn0.947Cd0.053O:Na homojunction. An optimized result with a resistivity of 67.43Ωcm, Hall mobility of 0.28cm2/Vs, and hole concentration of 3.31×1017 cm−3 is achieved, and electrically stable over several months. The chemical states of Na were analyzed by X-ray photoelectron spectro scopy. Room-temperature photoluminescence measurements exhibit redshift of the near-band-edge emission by alloying Cd. |
---|---|
ISSN: | 0925-8388 1873-4669 |
DOI: | 10.1016/j.jallcom.2013.09.071 |