Single event effect characterization of the mixed-signal ASIC developed for CCD camera in space use

Single event effect characterization of the mixed-signal ASIC developed for CCD camera in space use

We present the single event effect (SEE) tolerance of a mixed-signal application-specific integrated circuit (ASIC) developed for a charge-coupled device camera onboard a future X-ray astronomical mission. We adopted proton and heavy ion beams at HIMAC/NIRS in Japan. The particles with high linear e...

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Veröffentlicht in:Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment Accelerators, spectrometers, detectors and associated equipment, 2013-12, Vol.731, p.166-171
Hauptverfasser: Nakajima, Hiroshi, Fujikawa, Mari, Mori, Hideki, Kan, Hiroaki, Ueda, Shutaro, Kosugi, Hiroko, Anabuki, Naohisa, Hayashida, Kiyoshi, Tsunemi, Hiroshi, Doty, John P., Ikeda, Hirokazu, Kitamura, Hisashi, Uchihori, Yukio
Format: Artikel
Sprache:eng
Schlagworte:
ASIC
CCD camera
Charge coupled devices
Detectors
Latch-up
Onboard
Single event effect
Single Event Effects
Spectrometers
Tolerances
X-ray
X-rays
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Zusammenfassung:We present the single event effect (SEE) tolerance of a mixed-signal application-specific integrated circuit (ASIC) developed for a charge-coupled device camera onboard a future X-ray astronomical mission. We adopted proton and heavy ion beams at HIMAC/NIRS in Japan. The particles with high linear energy transfer (LET) of 57.9MeVcm2/mg is used to measure the single event latch-up (SEL) tolerance, which results in a sufficiently low cross-section of σSEL
ISSN:0168-9002
1872-9576
DOI:10.1016/j.nima.2013.05.146