Measurement of nanometer electron beam sizes with laser interference using Shintake Monitor

The Shintake Monitor is an essential beam tuning device installed at the interaction point (IP) of ATF2 [1], the final focus test beam line of the Accelerator Test Facility (ATF) to measure its nanometer order vertical e− beam sizes (σy⁎). The e− beam collides with a target of laser interference fri...

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Veröffentlicht in:Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment Accelerators, spectrometers, detectors and associated equipment, 2014-03, Vol.740, p.131-137
Hauptverfasser: Yan, Jacqueline, Yamaguchi, Yohei, Kamiya, Yoshio, Komamiya, Sachio, Oroku, Masahiro, Okugi, Toshiyuki, Terunuma, Nobuhiro, Kubo, Kiyoshi, Tauchi, Toshiaki, Urakawa, Junji
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Sprache:eng
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Zusammenfassung:The Shintake Monitor is an essential beam tuning device installed at the interaction point (IP) of ATF2 [1], the final focus test beam line of the Accelerator Test Facility (ATF) to measure its nanometer order vertical e− beam sizes (σy⁎). The e− beam collides with a target of laser interference fringes, and σy⁎ is derived from the modulation depth of the resulting Compton signal photons measured by a downstream photon detector. By switching between several laser crossing angle modes, it is designed to accommodate a wide range of σy⁎ from 20nm to a few micrometers with better than 10% accuracy. Owing to this ingenious technique, Shintake Monitor11The Shintake Monitor, invented by Dr. T. Shintake, had first been put into practical usage at the FFTB experiment at SLAC [4].[2,3] is the only existing device capable of measuring σy⁎
ISSN:0168-9002
1872-9576
DOI:10.1016/j.nima.2013.11.041