Crystal defects and their impact on ribbon growth on substrate (RGS) silicon solar cells
Ribbon Growth on Substrate (RGS) silicon wafers are casted directly from the silicon melt onto reusable substrates. Material losses by wafer sawing are omitted and high production speeds can be achieved. However, multicrystalline RGS silicon as it is produced today incorporates high densities of cry...
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Veröffentlicht in: | Solar energy materials and solar cells 2013-10, Vol.117, p.471-475 |
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Hauptverfasser: | , , , , |
Format: | Artikel |
Sprache: | eng |
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Online-Zugang: | Volltext |
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Zusammenfassung: | Ribbon Growth on Substrate (RGS) silicon wafers are casted directly from the silicon melt onto reusable substrates. Material losses by wafer sawing are omitted and high production speeds can be achieved. However, multicrystalline RGS silicon as it is produced today incorporates high densities of crystal defects and impurities limiting the efficiency of the corresponding solar cells. The local impact of crystal defects on material quality is estimated via models developed by Donolato and Micard et al.. By theoretically negating the impact of grain boundaries and dislocations, charge carrier diffusion lengths are still limited to values |
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ISSN: | 0927-0248 1879-3398 |
DOI: | 10.1016/j.solmat.2013.07.019 |