Different decoherence rates of an electron in a multi-state system induced by measurement

We study the different decoherence rates of a multi-state system, consisting of a single electron in three coupled wells, induced by a measurement at arbitrary voltage and temperature. Comparing the effects of the voltage to those of the temperature on dephasing, we show that the measurement voltage in certain sense plays a role of an effective temperature. However, we find that decoherence rates between the different eigenstates are different on the conditions of same voltage and temperature. To further comprehend the dephasing behaviors, we obtain the formulas of the decoherence rates and numerically show that the decoherence rates are influenced by the measurement voltage and temperature. In addition, in the large voltage and temperature regime, the effects of temperature and voltage on decoherence rates are different.